Vladimir Zolotov
University/Research Lab: IBM T.J. Watson Research Center
Location: (Yorktown Heights, NY)
Personal Research Web Page: http://www.research.ibm.com/da/DesignAuto.html
Keywords: design automation, timing analysis, statistical timing, circuit analysis, circuit optimization, signal integrity, VLSI testing
Location: (Yorktown Heights, NY)
Personal Research Web Page: http://www.research.ibm.com/da/DesignAuto.html
Keywords: design automation, timing analysis, statistical timing, circuit analysis, circuit optimization, signal integrity, VLSI testing
Posted on: Thursday, June 4th, 2009
Broad Research Area: Hardware / Architecture, Information Systems / Information Science, Numerical/Scientific Computing / HPC / Data-Intensive Scalable Computing, Other, Software Engineering, Theory / Algorithms
Research Interests:
Static timing analysis and statistical timing analysis of VLSI circuits, process variation analysis, at speed structural testing of digital circuits, circuit analysis, signal integrity, optimization of digital circuits, coupling noise analysis in digital circuits.
Contact Information:
email obfuscated - click to reveal
914-945-2562
