Siwei Lyu
Location: (Albany, NY)
Personal Research Web Page: http://www.cs.albany.edu/~lsw
Keywords: natural image statistics, graphical probabilistic models, low level computer vision, digital image forensics, machine learning
Posted on: Wednesday, April 28th, 2010
Broad Research Area: AI / Machine Learning / Robotics / Vision, Theory / Algorithms
Research Interests:
Statistical Properties of Natural Images:
A “prior” probability model for visual images (i.e., a specification of the likelihood that any given image would be seen) provides a powerful constraint for many applications in image processing, computer vision, and computer graphics. I’ve studied statistical image properties, developed developed parametric models for these properties, and used these models in a variety of applications in image processing, computer vision, and digital image forensics. In building such statistical models for natural images, we rely on machine learning methods to facilitate efficient computation, and theoretical and practical aspects of probabilistic graphical models are also my research interest.
I have just been awarded for an NSF CAREER award for 2010-2015.
Contact Information:
email: email obfuscated - click to reveal
phone: 518-442-5173
